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Computer Science > Computer Vision and Pattern Recognition

Title: Boosting Defect Detection in Manufacturing using Tensor Convolutional Neural Networks

Abstract: Defect detection is one of the most important yet challenging tasks in the quality control stage in the manufacturing sector. In this work, we introduce a Tensor Convolutional Neural Network (T-CNN) and examine its performance on a real defect detection application in one of the components of the ultrasonic sensors produced at Robert Bosch's manufacturing plants. Our quantum-inspired T-CNN operates on a reduced model parameter space to substantially improve the training speed and performance of an equivalent CNN model without sacrificing accuracy. More specifically, we demonstrate how T-CNNs are able to reach the same performance as classical CNNs as measured by quality metrics, with up to fifteen times fewer parameters and 4% to 19% faster training times. Our results demonstrate that the T-CNN greatly outperforms the results of traditional human visual inspection, providing value in a current real application in manufacturing.
Comments: 12 pages, 4 figures, 2 tables
Subjects: Computer Vision and Pattern Recognition (cs.CV); Artificial Intelligence (cs.AI); Machine Learning (cs.LG); Quantum Physics (quant-ph)
Cite as: arXiv:2401.01373 [cs.CV]
  (or arXiv:2401.01373v2 [cs.CV] for this version)

Submission history

From: Sukhbinder Singh [view email]
[v1] Fri, 29 Dec 2023 15:47:22 GMT (316kb,D)
[v2] Fri, 26 Apr 2024 16:07:25 GMT (316kb,D)

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